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Springer Handbook of Engineering Statistics

Springer Handbook of Engineering Statistics

Hoang Pham

 

Verlag Springer-Verlag, 2023

ISBN 9781447175032 , 1150 Seiten

2. Auflage

Format PDF

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373,43 EUR

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Springer Handbook of Engineering Statistics


 

In today's global and highly competitive environment, continuous improvement in the processes and products of any field of engineering is essential for survival. This book gathers together the full range of statistical techniques required by engineers from all fields. It will assist them to gain sensible statistical feedback on how their processes or products are functioning and to give them realistic predictions of how these could be improved. The handbook will be essential reading for all engineers and engineering-connected managers who are serious about keeping their methods and products at the cutting edge of quality and competitiveness.


Hoang Pham is a distinguished professor and former chairman (2007-2013) of the Department of Industrial and Systems Engineering at Rutgers University. Before joining Rutgers in 1993, he was a senior engineering specialist with the Idaho National Engineering Laboratory, Idaho Falls, Idaho, and Boeing Company in Seattle, Washington. His research areas include reliability modeling and prediction, software reliability, and statistical inference. He is editor-in-chief of the International Journal of Reliability, Quality and Safety Engineering and editor of Springer Series in Reliability Engineering and has been conference chair and program chair of over 40 international conferences and workshops. Dr. Pham is the author or coauthor of 7 books and has published over 200 journal articles, 100 conference papers, and edited 20 books including Springer Handbook of Engineering Statistics and Handbook of Reliability Engineering. He has delivered over 40 invited keynote and plenary speeches at many international conferences and institutions. His numerous awards include the 2009 IEEE Reliability Society Engineer of the Year Award. He is a fellow of the IEEE, AAIA, and IISE.